Ampahany :
SN74BCT8374ADWRG4
Manufacturer :
Texas Instruments
Description :
IC SCAN TEST DEVICE 24SOIC
Type logic :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Volavolan-tsakafo :
4.5V ~ 5.5V
Ny mari-pana :
0°C ~ 70°C
Type Type :
Surface Mount
Famonosana / tranga :
24-SOIC (0.295", 7.50mm Width)
Package Fitaovana mpamatsy :
24-SOIC