Ampahany :
SN74BCT8374ANT
Manufacturer :
Texas Instruments
Description :
IC SCAN TEST DEVICE W/FF 24-DIP
Type logic :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Volavolan-tsakafo :
4.5V ~ 5.5V
Ny mari-pana :
0°C ~ 70°C
Famonosana / tranga :
24-DIP (0.300", 7.62mm)
Package Fitaovana mpamatsy :
24-PDIP